2007 Papers

An Introduction to the National Voluntary Laboratory Accreditation Program
- Sally Bruce, NVLAP


NVLAP Draft Summary of Round 11 Compact Fluorescent Results
- Dr. Larry Knab, NVLAP


IESNA Approved Method for the Electrical and Photometric Measurements of Solid-State Lighting Products - Draft 4.0
- Dr. Ron Daubach


The Role of the CIE and the U.S. National Committee in Establishing Standards for Measurement and Characterization of Solid State Lighting Equipment and Products
- Anderson


US Government Participation in Consensus Standards Development: OMB Circular A-119
- Daryl Myers, NREL


NIST Role in Supporting the Solid State Lighting Initiative
- Dr. Yoshi Ohno, NIST


Standardization of LED measurements; New Pulication of CIE Technical Report # 127:2007
- Dr. Kathleen Murray, Inphora Inc.


ASTM Standards on Color and Appearance
- RobertT. Marcus, Sun Chemical Corporation


The Measurement of Color and ISO/IEC 17025
- Gene Zerlaut, SC-International Inc.


Flux-OMeter, Making Measurements more Accessible
- Robert L. Donofrio, Display Device Consultants LLC


Mesopic LED Light Source for Automotive Luminance and Color Measurements
- Andrew Bierman, Martin Overington, LRC


A History of Solar and Ultraviolet Radiometer Calibration Standards
- Gene Zerlaut and Warren Ketola


Weathering Testing for Retroreflective Sheetings
- W.D. Ketola


Spatial Stray Light Correction for Imaging Instruments Using the Matrix Method
- Yuqin Zong


Preliminary Measurement of the Termperature of a Blackbody using Filter Radiometers
- Charles Bamber, L.P. Boivin, A. Gaertner,F. Gauthier, R. Gerson, D. Woods; NRC


Novel Flux Calibration Source
- David C. Gross, Osram Sylvania


Long Term Stability of Bi-Planar Vacuum Photodiodes
- Chris Brumage


Flash Pyrometry Techniques for Health Hazard Evaluation
- Terry L. Lyon, USACHPPM


Filter Radiometers for Weathering and Photo Stability Tests
- Artur Schonlein, ATLAS Material Testing Technolgy GmbH


Characterization of Integrating Spheres for Ultraviolet Radiometry
- Ping-Shine Shaw, ZhigLi, Uwe Arp, Howard W. Yoon, Robert D. Saunders, Keith Lykke, NIST