2011 Presentations
Workshop
Fundamentals of uncertainty analysis for optical measurements: Where do I start?
- Cameron Miller
Case Study: Uncertainty analysis for luminance ratio measurements
- Cameron Miller
Case study: Uncertainty analysis for NIST spectral irradiance measurements
- Howard Yoon
Case study: Uncertainty analysis for NIST reflectance colorimetry measurements
- Maria Nadal
Uncertainty budgets for integrated photometric measurements
- Rolf Bergman
Case study: Uncertainty analysis for integrating goniometric measurements
- Cameron Miller
SSL Novel Ideas/Applications, Standardization Updates
A Practical Photometer for CIE Performance Based Mesopic Photometry System
- Tatsukiyo Uchida
Proficiency Test Group 12 results
- Rolf Bergman
Calculation of CCT and Duv and Practical Conversion Formulae
- Yoshi Ohno
Development of a 365 nm LED Source as a UV Transfer Standard
- Dr. Shen Zhu
Fluorescence errors in integrating sphere measurements of remote phosphor type LED light sources
- Arno Keppens
– Presented by Yuqin Zong
Practical Ideas and Tips for Laboratory Measurements
TM- 21 Update: Method for Projecting Lumen Maintenance of LEDs
- Eric Richman
Real- time Passive Fluorescence Spectra of Induced Stress in Vegetation
- Arnold Theisen
Review of Commercial Light Meter Calibration
- K Frank Lin
Practical Lumen Maintenance Testing Using LM - 80 - A discussion of Best Practics and Recent Standards Activity
- Jeff Hulett
A closer look at photobiological safety measurements
- Egbert Lenderink
Simple silicon photodiode based femto- watt measurement system and its implication –
- Yuqin Zong
Frank Grum Memorial Lecture
“A view from the other side of technology: SSL, market forces, politics, and communication”
- Dale Work
Optical Properties of Materials
Characterisation of Fluorescent Materials
- Sven Leyre
Results of a Nationwide Intercomparison of Infrared Spectral Reflectance Capabilities – - Boris Wilthan/Leonard Hanssen
A high- power, tunable, supercontinuum- based VIS- SWIR light source for the STARR II gonioreflectometer
- Heather Patrick/and Clarence J. Zarobila
Integrating sphere superposition technique for quantifying the linearity of InGaAs detectors
- Angelo Arecchi
Laboratory Versus Production SSL Metrology
Laboratory versus Production SSL Metrology: Lessons and Questions from CALiPER
- Mia Paget
– Presented by Eric Richman
Thermal issues in relation to metrics reported on LED data sheets
- Andras Poppe
Calibrating Optical Sensors for Semiconductor Process Control
- John Corless
CALiPER Deep Dive Long- Term Testing—Correlation from SSL Device Performance to End Product
- Mia Paget
– Presented by Eric Richman