2012 Presentations

Solid State Lighting (SSL) Technology and Metrology

Understanding TM-30 vs. CRI
- Yoshi Ohno, NIST


Review of Results of NVLAP Proficiency Test 14
- Rolf Bergman, Rolf Bergman Consulting


Current Source Induced LED Photometric Measurement Variations
- Jeff Hulett, Vektrex


New CIE TC on Broadband UV LED Radiometric Measurements, 320 nm to 420 nm
- George Eppeldauer, NIST

Workshop: Visual Anomalies in Solid-State Lighting

CIE 170-2 - Cone-Fundamental-Based Colorimetry and Photometry
- Youngshin Kwak, NIST / UNIST, Korea


Melanopsin, True Brightness and the Recalibration of Light Meters
- Sam Berman, Lawrence Berkeley National Laboratory (Emeritus) & Bradley Schlesselman, Musco Sports Lighting



Federal Aviation Administration Lighting Research and Development 

- Donald Gallagher, Federal Aviation Administration (FAA) Special Session: Emerging Professionals - Chair: Mark Jongewaard


Quantifying View: A Way Forward to Statistically Analyzing the Effect of View on Human Performance
- Arpan Guha & Clarence E. Waters, University of Nebraska-Lincoln


Field and Laboratory Measurements of High Flux LED Luminaires Designed for High-Temperature Environments
- Andrea M. Wilkerson, PNNL


Recent Progress in the Optical Characterization of Carbon Nanotubes
- Yanmei Piao, NIST


Phase-space Tomography for Measuring Partially Coherent Fields of Light Sources
- Rui Qi, Liangyu Qiu, & Miguel Alonso, University of Rochester

Display Metrology

Multispectral Measurements of Emissive and Reflective Properties of Displays
- Pierre Boher, Thierry Leroux, Thibault Bignon, & Véronique Collomb-Patton, ELDIM


Optical Measuring Methods for Transparent Displays
- John Penczek and Paul Boynton, NIST

Optical Properties of Materials

Measuring Forward Fluorescence in Remote Phosphors Used in LED Luminaires
Clarence Zarobila, NIST


The Need for Long-Term Quantitative Characterization of SSL Diffusers
- Emil Radkov, SORAA


Measurements of the Hemispherical Reflectance and the Optical Properties of a Quartz Diffuser
- Paul Lemaillet, NIST


Diffuse Reflectance and Light Trapping from Textured Silicon Surfaces in Photovoltaic Applications
- Thom Germer, NIST, et al.

Current Research at National Metrology Institutes

Current Research Activities at NRC
A.A. Gaertner, A. Gamouras, & J.C. Zwinkels, NRC


PV Characterization Metrology at NIST
Behrang Hamadani, NIST


Radiometric Measurement Traceability Paths for Photovoltaic Calibrations
Howard Yoon, NIST


Current Capabilities in Photometry and Radiometry at CENAM
Noe Vidal, Tatiana Ortega, & Carlos Matamoros, CENAM


Why Should We Care for the 400nm UV Upper Limit and the Effectiveness of the Resistance to Radiance Test on the Standards? 
Liliane Ventura & Mauro Masili, University of São Paulo


Franc Grum Memorial Banquet and Lecture
David H. Sliney, Ph.D.

UV Radiometry

CIE Guide to the Measurement of Upper Room UVGI Luminaires: CIE TC 6-52
Richard L. Vincent, Icahn School of Medicine, Mt. Sinai


Comparison of Commercial UV LED Sources and Radiometers
Robert F. Berg, NIST


The New SURF Beamline 3
Robert Vest, NIST


Industry Needs for UV LED Radiometry
Robin Wright, 3M


Proposed LED UV Bands; New Radiometric Methods for Measurement of the Bands
Joe May, EIT


Accurately Measuring UV Sources
Darrin Leonhardt, Heraeus Noblelight America LLC