2013 Presentations

ROSI: the NIST Robotic Optical Scatter Instrument for UV-SWIR Goniometric Reflectance Measurements
- Heather J. Patrick, NIST


Applications of Spectrophotometry in the study of Plasmonic Nanostructures
- Li-Lin Tay, National Research Council Canada


NIST Emittance and Non-Contact Temperature Metrology in Support of Advanced Manufacturing
- Sergey Mekhontsev, NIST


Measurement of Low-Level Infrared Diffuse Reflectance
- Leonard Hanssen, NIST


Problems and solutions in accurate measurement of directional reflectance and transmittance of diffusing and textured samples with a UV/Vis/NIR spectrophotometer.
- Peter A.van Nijnatten, OMT Solutions BV


A Cryogenic Vacuum facility for characterization of optical materials for Space applications
- Peter A.van Nijnatten, OMT Solutions BV


A Cryogenic Vacuum facility for characterization of optical materials for Space applications
- Peter A.van Nijnatten, OMT Solutions BV


Report on TC 1-89 Enhancement of Images for Color Defective Observers
- Po-Chieh Hung, Ph.D. Konica Minolta Laboratory, USA


Field Measurements of New Retroreflective Highway Sign Materials
- John Bullough, Ph.D., Lighting Research Center, Renssalaer Polytechnic Institute


Design of Mesopic Photometers Based on CIE 191
- Tatsukiyo Uchida, Panasonic Corp., Osaka, Japan


Method of Characterizing Flicker
- Michael Poplowski, Pacific Northwest National Laboratory


CIE Work on Test Method for Measurement of Solid State Lighting Products and Uncertainty Evaluation
- Yoshi Ohno, Ph.D., NIST


CIE/USA Division Reports
- Alan Lewis, O.D., Ph.D. President, CIE/USA


Evolving Requirements for NVLAP Accreditation to IES-LM-79 – Equipment Calibration and Uncertainty Analysis
- Jim Leland, Copia LLC


Uncertainty: An Overview
- David Gross, Osram Sylvana


Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Photometer
- Jim Leland, Copia LLC


Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Spectroradiometer
- Andrew Jackson, Philips Lighting Company


Case Study: Spectra, correlation and NIST standards
- David Gross, Osram-Sylvana


Embracing Uncertainty: Perspectives on Uncertainty in an Uncertain World
- Michael Grather


Minimizing Current Source-Induced Errors in LM-85 Measurements
- Jeff Hulett, Vektrex


Airborne Aerosol Light Scattering Measurements by a Portable Instrument: Validation and Errors
- Gergely Dolgos, Department of Physics, University of Maryland
- J. Vanderlei Martins, bJoint Center for Earth Systems Technology, University of Maryland


New tools to lower the uncertainty of measurements in the night vision goggle spectral region
- Rob Hamill, Gamma Scientific


Improvements to LM-79 to guide the user around potential pitfalls in Solid-State Lighting measurements
- Cameron Miller, NIST