CORM
Council for Optical Radiation Measurements
2013 Presentations
ROSI: the NIST Robotic Optical Scatter Instrument for UV-SWIR Goniometric Reflectance Measurements
Heather J. Patrick,  NIST


Applications of Spectrophotometry in the study of Plasmonic Nanostructures
Li-Lin Tay, National Research Council Canada


NIST Emittance and Non-Contact Temperature Metrology in Support of Advanced Manufacturing
Sergey Mekhontsev, NIST


Measurement of Low-Level Infrared Diffuse Reflectance
Leonard Hanssen, NIST


Problems and solutions in accurate measurement of directional reflectance and transmittance of diffusing and textured samples with a UV/Vis/NIR spectrophotometer.
Peter A.van Nijnatten, OMT Solutions BV


A Cryogenic Vacuum facility for characterization of optical materials for Space applications
Peter A.van Nijnatten, OMT Solutions BV


A Cryogenic Vacuum facility for characterization of optical materials for Space applications
Peter A.van Nijnatten, OMT Solutions BV


Report on TC 1-89  Enhancement of Images for Color Defective Observers
Po-Chieh Hung, Ph.D.  Konica Minolta Laboratory, USA


Field Measurements of New Retroreflective Highway Sign Materials
John Bullough, Ph.D., Lighting Research Center, Renssalaer Polytechnic Institute


Design of Mesopic  Photometers  Based on CIE 191
Tatsukiyo Uchida, Panasonic Corp., Osaka, Japan


Method of Characterizing Flicker
Michael Poplowski, Pacific Northwest National Laboratory


CIE Work on Test Method for Measurement of Solid State Lighting Products and Uncertainty Evaluation
Yoshi Ohno, Ph.D., NIST


CIE/USA Division Reports
Alan Lewis, O.D., Ph.D.   President, CIE/USA


Evolving Requirements for NVLAP Accreditation to IES-LM-79 – Equipment Calibration and Uncertainty Analysis
Jim Leland, Copia LLC


Uncertainty: An Overview
David Gross, Osram Sylvana


Case Study:  Calibration Uncertainty Analysis for an Integrating Sphere Photometer
Jim Leland, Copia LLC


Case Study:  Calibration Uncertainty Analysis for an Integrating Sphere Spectroradiometer
Andrew Jackson, Philips Lighting Company


Case Study:  Spectra, correlation and NIST standards
David Gross, Osram-Sylvana


Embracing Uncertainty:  Perspectives on Uncertainty in an Uncertain World
Michael Grather


Minimizing Current Source-Induced Errors in LM-85 Measurements
Jeff Hulett, Vektrex


Airborne Aerosol Light Scattering Measurements by a Portable Instrument: Validation and Errors
Gergely Dolgos, Department of Physics, University of Maryland
J. Vanderlei Martins, bJoint Center for Earth Systems Technology, University of Maryland


New tools to lower the uncertainty of measurements in the night vision goggle spectral region
Rob Hamill, Gamma Scientific


Improvements to LM-79 to guide the user around potential pitfalls in Solid-State Lighting measurements
Cameron Miller, NIST

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