CORM
Council for Optical Radiation Measurements
2014 Presentations

ROSI: the NIST Robotic Optical Scatter Instrument for UV-SWIR Goniometric
Reflectance Measurements
Heather J. Patrick, NIST


Applications of Spectrophotometry in the study of Plasmonic Nanostructures
Li-Lin Tay, National Research Council Canada


NIST Emittance and Non-Contact Temperature Metrology in Support of Advanced
Manufacturing
Sergey Mekhontsev, NIST


Measurement of Low-Level Infrared Diffuse Reflectance
Leonard Hanssen, NIST


Problems and solutions in accurate measurement of directional reflectance and
transmittance of diffusing and textured samples with a UV/Vis/NIR spectrophotometer
Peter A.van Nijnatten, OMT Solutions BV


A Cryogenic Vacuum facility for characterization of optical materials for Space
applications
Peter A.van Nijnatten, OMT Solutions BV


Report on TC 1-89 Enhancement of Images for Color Defective Observers
Po-Chieh Hung, Ph.D. Konica Minolta Laboratory, USA


Field Measurements of New Retroreflective Highway Sign Materials
John Bullough, Ph.D., Lighting Research Center, Rensselaer Polytechnic Institute


Design of Mesopic Photometers Based on CIE 191
Tatsukiyo Uchida, Panasonic Corp., Osaka, Japan


Method of Characterizing Flicker
Michael Poplowski, Pacific Northwest National Laboratory


CIE Work on Test Method for Measurement of Solid State Lighting Products and
Uncertainty Evaluation
Yoshi Ohno, Ph.D., NIST


CIE/USA Division Reports
Alan Lewis, O.D., Ph.D. President, CIE/USA


Evolving Requirements for NVLAP Accreditation to IES-LM-79 – Equipment Calibration
and Uncertainty Analysis
James E. Leland, Copia LLC


Basics of Uncertainty
David Gross, OSRAM


Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Photometer
James E. Leland, Copia LLC


Case Study: Calibration Uncertainty Analysis for an Integrating Sphere
Spectroradiometer
Andrew Jackson, Philips Lighting Company


Case Study: Interpolation, Correlation and NIST standards
David Gross, OSRAM


Embracing Uncertainty: Perspectives on Uncertainty in an Uncertain World
Michael Grather, Michael Grather Consulting


A Pleasure to See: the art and science of lighting art museums
Scott Rosenfeld, Lighting Designer, Smithsonian Institute


Minimizing Current Source-Induced Errors in LM-85 Measurements
Jeff Hulett, Vektrex


Airborne Aerosol Light Scattering Measurements by a Portable Instrument: Validation
and Errors
Gergely Dolgos, Department of Physics, University of Maryland, J. Vanderlei Martins, Joint Center for Earth Systems Technology, University of Maryland


Improvements to LM-79 to guide the user around potential pitfalls in Solid-State Lighting
measurements

Cameron Miller, NIST


Effects of Using Database of a Large Number of Samples for Color Rendering Metrics
Yoshi Ohno, NIST

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