2012 Presentations

Session II

Colour-tunable LED office lighting: harnessing new capabilities while saving Energy, Jennifer A. Veitch, Erhan E. Dikel, Gregory J. Burns, Sandra Mancini, and Guy R. Newsham (NRC, Canada)

Method for measurement of LEDs at elevated temperature of 85 ºC in Production, Ralph Tuttle (Cree, USA)

Hemisphere-based automated measurement system for high power LEDs, Jeff Hulett (Vektrex, USA)

An experimental approach to a definition of the mesopic adaptation field, Tatsukiyo Uchida (Panasonic, Japan /NIST, USA), Yoshi Ohno (NIST, USA)

Pulse-to-cw laser convertor and its application in the new spectral responsivity calibration facility at PTB, Stefan Winter, T. Fey, I. Kröger (PTB, Germany)

Research on measurement methods for organic light-emitting diodes, Tokihisa Kawabata (Konica Minolta Holdings, Inc., Japan / NIST, USA)

Methods for estimating junction temperature of AC LEDs, Asiri Jayawardena, Yi-wei Liu, and Nadarajah Narendran (Lighting Research Center, Rensselaer Polytechnic Institute, USA)

Measurement of LEDs at wafer level, Pei-ting Chou (ITRI, Taiwan)

New JEDEC thermal testing standards for high power LEDs, Andras Poppe (Mentor Graphics MAD MicReD & Budapest University of Technology and Economics, Hungary)

Quantifying stroboscopic effects from flickering light sources, John Bullough and N. Narendran (Lighting Research Center, Rensselaer Polytechnic Institute, USA)

Standardization and measurement of optical radiation related to photobiological safety, Tongsheng Mou (Zhejiang University, China) and Jianping Wang (Sensing Instruments Co., Ltd., China)