2013 Presentations
Practical Optical Measurements of OLED Panels for Lighting Applications
Toki Kawabata, Konica Minolta, Inc.
Yoshi Ohno, National Institute of Standards and Technology
Color Point Stability in SSL Products
Ralph C. Tuttle
Cree, Inc
Uncertainty Evaluation for Color Measurements for Solid State Lighting Sources
Yoshi Ohno NIST Fellow
Overview of new SSL Standards under Development through the IES/TPC
Cameron Miller NIST
NIST traceable photocurrent measurements
George P. Eppeldauer H. W. Yoon, D. G. Jarrett, and T. C. Larason
Spectral Measurements of Plasma Lamps
G G Lister, M. Bowden, N. StJ. Braithwaite
Putting Measurements on an Absolute Scale When There are no Standards: An Example with X-ray Induced Fluorescence
John J Curry NIST
Advantages and Applications for the Use of Imaging Colorimeters
Jens Jørgen Jensen, Ms. Sc.
Staff Optical Software Engineer
Radiant Zemax, LLC
Measurement and Application of “BUG” (Backlight, Uplight and Glare) Ratings for Outdoor Lighting
Graeme G Lister and David M Keith
Examples of Applying Mesopic Factors in Roadway Calculations
D. Keith & S. Wentworth
Outdoor Lighting and Mesopic Vision
John D. Bullough
Measuring the Luminous Effectiveness of Images
Thomy H. Nilsson
Characterization Of Diffuse Reflections From Handheld Display Devices For Medical Image Viewing
Peter Liu and Aldo Badano
Spectral Sensitivity in Night Driving:Dependence on Adaptation, Location, Task, and Whatnot
Michael J. Flannagan University of Michigan
Transportation Research Institute
FHWA Research Related to Roadway Signs & Displays
C. Y. David Yang, Ph.D.
Vehicle Displays Specifications & Measurements
- Robert Donofrio - Display Device Consultants LLC -Ann Arbor
MI Dr. John Troxell - Consultant
Randy Klimek - Midwest Sales Manager of Konica Minolta Sensing
ROSI: the NIST Robotic Optical Scatter Instrument for UV-SWIR Goniometric Reflectance Measurements
- Heather J. Patrick, NIST
Applications of Spectrophotometry in the study of Plasmonic Nanostructures
- Li-Lin Tay, National Research Council Canada
NIST Emittance and Non-Contact Temperature Metrology in Support of Advanced Manufacturing
- Sergey Mekhontsev, NIST
Measurement of Low-Level Infrared Diffuse Reflectance
- Leonard Hanssen, NIST
Problems and solutions in accurate measurement of directional reflectance and transmittance of diffusing and textured samples with a UV/Vis/NIR spectrophotometer.
- Peter A.van Nijnatten, OMT Solutions BV
A Cryogenic Vacuum facility for characterization of optical materials for Space applications
- Peter A.van Nijnatten, OMT Solutions BV
A Cryogenic Vacuum facility for characterization of optical materials for Space applications
- Peter A.van Nijnatten, OMT Solutions BV
Report on TC 1-89 Enhancement of Images for Color Defective Observers
- Po-Chieh Hung, Ph.D. Konica Minolta Laboratory, USA
Field Measurements of New Retroreflective Highway Sign Materials
- John Bullough, Ph.D., Lighting Research Center, Renssalaer Polytechnic Institute
Design of Mesopic Photometers Based on CIE 191
- Tatsukiyo Uchida, Panasonic Corp., Osaka, Japan
Method of Characterizing Flicker
- Michael Poplowski, Pacific Northwest National Laboratory
CIE Work on Test Method for Measurement of Solid State Lighting Products and Uncertainty Evaluation
- Yoshi Ohno, Ph.D., NIST
CIE/USA Division Reports
- Alan Lewis, O.D., Ph.D. President, CIE/USA
Evolving Requirements for NVLAP Accreditation to IES-LM-79 – Equipment Calibration and Uncertainty Analysis
- Jim Leland, Copia LLC
Uncertainty: An Overview
- David Gross, Osram Sylvana
Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Photometer
- Jim Leland, Copia LLC
Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Spectroradiometer
- Andrew Jackson, Philips Lighting Company
Case Study: Spectra, correlation and NIST standards
- David Gross, Osram-Sylvana
Embracing Uncertainty: Perspectives on Uncertainty in an Uncertain World
- Michael Grather
Minimizing Current Source-Induced Errors in LM-85 Measurements
- Jeff Hulett, Vektrex
Airborne Aerosol Light Scattering Measurements by a Portable Instrument: Validation and Errors
- Gergely Dolgos, Department of Physics, University of Maryland
- J. Vanderlei Martins, bJoint Center for Earth Systems Technology, University of Maryland
New tools to lower the uncertainty of measurements in the night vision goggle spectral region
- Rob Hamill, Gamma Scientific
Improvements to LM-79 to guide the user around potential pitfalls in Solid-State Lighting measurements
- Cameron Miller, NIST