2013 Presentations
FHWA Research Related to Roadway Signs & Displays
- C. Y. David Yang, Ph.D.
Turner-Fairbank Highway Research Center
Vehicle Displays Specifications & Measurements
- Robert Donofrio - Display Device Consultants LLC -Ann Arbor , MI
Dr. John Troxell - Consultant
Randy Klimek - Midwest Sales Manager of Konica Minolta Sensing
Spectral Sensitivity in Night Driving: Dependence on Adaptation, Location, Task, and Whatnot
- Michael J. Flannagan
University of Michigan
Transportation Research Institute
Characterization of Diffuse Reflections from Handheld Display Devices for Medical Image Viewing
- Peter Liu and Aldo Badano
Division of Imaging and Applied Mathematics, Office of Science and Engineering Laboratories
Center for Devices and Radiological Health, Food and Drug Administration
Measuring the Luminous Effectiveness of Images
- Thomy H. Nilsson
Psychology Department, University of Prince Edward Island
Design of Mesopic Photometers Based on CIE 191
- Tatsukiyo Uchida, Panasonic Corp., Osaka, Japan
Outdoor Lighting and Mesopic Vision
- John D. BulloughLighting Research Center, Rensselaer Polytechnic Institute
Examples of Applying Mesopic Factors in Roadway Calculations
- D. Keith & S. Wentworth
Measurement and Application of “BUG” (Backlight, Uplight and Glare) Ratings for Outdoor Lighting
Graeme G Lister and David M Keith
Advantages and Applications for the Use of Imaging Colorimeters
- Jens Jørgen Jensen, Ms. Sc.
Staff Optical Software Engineer, Radiant Zemax, LLC
Putting Measurements on an Absolute Scale When There are no Standards: An Example with X-ray Induced Fluorescence
- John J. Curry, NIST
Spectral Measurements of Plasma Lamps
-G G Lister, M. Bowden, N. StJ. Braithwaite
NIST traceable photocurrent measurements
-George P. EppeldauerH. W. Yoon, D. G. Jarrett, and T. C. Larason
Overview of new SSL Standards under Development through the IES/TPC
-Cameron Miller, NIST
Uncertainty Evaluation for Color Measurements for Solid State Lighting Sources
- Yoshi Ohno, NIST Fellow
Color Point Stability in SSL Products
- Ralph C. Tuttle, Cree, Inc
Practical Optical Measurements of OLED Panels for Lighting Applications
- Toki Kawabata. Konica Minolta, Inc. Japan
- Yoshi Ohno, National Institute of Standards and Technology USA