Workshop
Fundamentals of uncertainty analysis for optical measurements: Where do I start?
Cameron MillerCase Study: Uncertainty analysis for luminance ratio measurements
Cameron MillerCase study: Uncertainty analysis for NIST spectral irradiance measurements
Howard Yoon
Case study: Uncertainty analysis for NIST reflectance colorimetry measurements
Maria Nadal
Uncertainty budgets for integrated photometric measurements
Rolf Bergman
Case study: Uncertainty analysis for integrating goniometric measurements
Cameron Miller
SSL Novel Ideas/Applications, Standardization Updates
A Practical Photometer for CIE Performance Based Mesopic Photometry System
Tatsukiyo UchidaProficiency Test Group 12 results
Rolf Bergman
Calculation of CCT and Duv and Practical Conversion Formulae
Yoshi Ohno
Development of a 365 nm LED Source as a UV Transfer Standard
Dr. Shen ZhuFluorescence errors in integrating sphere measurements of remote phosphor type LED light sources
Arno Keppens - Presented by Yuqin Zong
Practical Ideas and Tips for Laboratory Measurements
TM- 21 Update: Method for Projecting Lumen Maintenance of LEDs
Eric Richman
Real- time Passive Fluorescence Spectra of Induced Stress in Vegetation
Arnold Theisen
Review of Commercial Light Meter Calibration
K Frank Lin
A closer look at photobiological safety measurements
Egbert Lenderink
Simple silicon photodiode based femto- watt measurement system and its implication
Yuqin Zong
Frank Grum Memorial Lecture
“A view from the other side of technology: SSL, market forces, politics, and communication”
Dale WorkOptical Properties of Materials
Characterisation of Fluorescent Materials
Sven LeyreResults of a Nationwide Intercomparison of Infrared Spectral Reflectance Capabilities
Boris Wilthan/Leonard Hanssen
A high- power, tunable, supercontinuum- based VIS- SWIR light source for the STARR II gonioreflectometer
Heather Patrick/and Clarence J. Zarobila
Integrating sphere superposition technique for quantifying the linearity of InGaAs detectors
Angelo Arecchi
Laboratory Versus Production SSL Metrology
Laboratory versus Production SSL Metrology: Lessons and Questions from CALiPER
Mia Paget - Presented by Eric RichmanThermal issues in relation to metrics reported on LED data sheets
Andras Poppe
Calibrating Optical Sensors for Semiconductor Process Control
John Corless
CALiPER Deep Dive Long- Term Testing—Correlation from SSL Device Performance to End Product
Mia Paget - Presented by Eric Richman