2014 Presentations

ROSI: the NIST Robotic Optical Scatter Instrument for UV-SWIR Goniometric Reflectance Measurements
- Heather J. Patrick, NIST

Applications of Spectrophotometry in the study of Plasmonic Nanostructures
- Li-Lin Tay, National Research Council Canada

NIST Emittance and Non-Contact Temperature Metrology in Support of Advanced Manufacturing
- Sergey Mekhontsev, NIST

Measurement of Low-Level Infrared Diffuse Reflectance
- Leonard Hanssen, NIST

Problems and solutions in accurate measurement of directional reflectance and transmittance of diffusing and textured samples with a UV/Vis/NIR spectrophotometer
- Peter A.van Nijnatten, OMT Solutions BV

A Cryogenic Vacuum facility for characterization of optical materials for Space applications
- Peter A.van Nijnatten, OMT Solutions BV

Report on TC 1-89 Enhancement of Images for Color Defective Observers
- Po-Chieh Hung, Ph.D. Konica Minolta Laboratory, USA

Field Measurements of New Retroreflective Highway Sign Materials
- John Bullough, Ph.D., Lighting Research Center, Rensselaer Polytechnic Institute

Design of Mesopic Photometers Based on CIE 191
- Tatsukiyo Uchida, Panasonic Corp., Osaka, Japan

Method of Characterizing Flicker
- Michael Poplowski, Pacific Northwest National Laboratory

CIE Work on Test Method for Measurement of Solid State Lighting Products and Uncertainty Evaluation
- Yoshi Ohno, Ph.D., NIST

CIE/USA Division Reports
- Alan Lewis, O.D., Ph.D. President, CIE/USA

Evolving Requirements for NVLAP Accreditation to IES-LM-79 – Equipment Calibration and Uncertainty Analysis
- James E. Leland, Copia LLC

Basics of Uncertainty
- David Gross, OSRAM

Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Photometer
- James E. Leland, Copia LLC

Case Study: Calibration Uncertainty Analysis for an Integrating Sphere Spectroradiometer
- Andrew Jackson, Philips Lighting Company

Case Study: Interpolation, Correlation and NIST standards
- David Gross, OSRAM

Embracing Uncertainty: Perspectives on Uncertainty in an Uncertain World
- Michael Grather, Michael Grather Consulting

A Pleasure to See: the art and science of lighting art museums
- Scott Rosenfeld, Lighting Designer, Smithsonian Institute

Minimizing Current Source-Induced Errors in LM-85 Measurements
- Jeff Hulett, Vektrex

Airborne Aerosol Light Scattering Measurements by a Portable Instrument: Validation and Errors
Gergely Dolgos, Department of Physics, University of Maryland, J. Vanderlei Martins, Joint Center for Earth Systems Technology, University of Maryland

Improvements to LM-79 to guide the user around potential pitfalls in Solid-State Lighting measurements
- Cameron Miller, NIST

Effects of Using Database of a Large Number of Samples for Color Rendering Metrics
- Yoshi Ohno, NIST