2016 Presentations
Solid State Lighting (SSL) Technology and Metrology
Understanding TM-30 vs. CRI
Yoshi Ohno, NIST
Review of Results of NVLAP Proficiency Test 14
Rolf Bergman, Rolf Bergman Consulting
Current Source Induced LED Photometric Measurement Variations
Jeff Hulett, Vektrex
New CIE TC on Broadband UV LED Radiometric Measurements, 320 nm to 420 nm
George Eppeldauer, NIST
Workshop: Visual Anomalies in Solid-State Lighting
CIE 170-2 - Cone-Fundamental-Based Colorimetry and Photometry
Youngshin Kwak, NIST / UNIST, Korea
Melanopsin, True Brightness and the Recalibration of Light Meters
Sam Berman, Lawrence Berkeley National Laboratory (Emeritus) & Bradley Schlesselman, Musco Sports Lighting
Federal Aviation Administration Lighting Research and Development
Donald Gallagher, Federal Aviation Administration (FAA) Special Session: Emerging Professionals - Chair: Mark Jongewaard
Quantifying View: A Way Forward to Statistically Analyzing the Effect of View on Human Performance
Arpan Guha & Clarence E. Waters, University of Nebraska-Lincoln
Field and Laboratory Measurements of High Flux LED Luminaires Designed for High-Temperature Environments
Andrea M. Wilkerson, PNNL
Recent Progress in the Optical Characterization of Carbon Nanotubes
Yanmei Piao, NIST
Phase-space Tomography for Measuring Partially Coherent Fields of Light Sources
Rui Qi, Liangyu Qiu, & Miguel Alonso, University of Rochester
Display Metrology
Multispectral Measurements of Emissive and Reflective Properties of Displays
Pierre Boher, Thierry Leroux, Thibault Bignon, & Véronique Collomb-Patton, ELDIM
Optical Measuring Methods for Transparent Displays
John Penczek and Paul Boynton, NIST
Optical Properties of Materials
Measuring Forward Fluorescence in Remote Phosphors Used in LED Luminaires
Clarence Zarobila, NIST
The Need for Long-Term Quantitative Characterization of SSL Diffusers
Emil Radkov, SORAA
Measurements of the Hemispherical Reflectance and the Optical Properties of a Quartz Diffuser
Paul Lemaillet, NIST
Diffuse Reflectance and Light Trapping from Textured Silicon Surfaces in Photovoltaic Applications
Thom Germer, NIST, et al.
Current Research at National Metrology Institutes
Current Research Activities at NRC
A.A. Gaertner, A. Gamouras, & J.C. Zwinkels, NRC
PV Characterization Metrology at NIST
Behrang Hamadani, NIST
Radiometric Measurement Traceability Paths for Photovoltaic Calibrations
Howard Yoon, NIST
Current Capabilities in Photometry and Radiometry at CENAM
Noe Vidal, Tatiana Ortega, & Carlos Matamoros, CENAM
Why Should We Care for the 400nm UV Upper Limit and the Effectiveness of the Resistance to Radiance Test on the Standards?
Liliane Ventura & Mauro Masili, University of São Paulo
Franc Grum Memorial Banquet and Lecture
David H. Sliney, Ph.D.
UV Radiometry
CIE Guide to the Measurement of Upper Room UVGI Luminaires: CIE TC 6-52
Richard L. Vincent, Icahn School of Medicine, Mt. Sinai
Comparison of Commercial UV LED Sources and Radiometers
Robert F. Berg, NIST
The New SURF Beamline 3
Robert Vest, NIST
Industry Needs for UV LED Radiometry
Robin Wright, 3M
Proposed LED UV Bands; New Radiometric Methods for Measurement of the Bands
Joe May, EIT
Accurately Measuring UV Sources
Darrin Leonhardt, Heraeus Noblelight America LLC